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A measure of assessment of uncontrolled space image classification by a clustering technique based on a multivariate histogram is proposed. The measure is used to choose the best vector partitions corresponding to different detail of data representation. It is experimentally shown that well-separated unimodal clusters of the partitions correspond to representative information classes of a sensed land cover.

A four-channel point object image filtering algorithm obtained by modifying an adaptive filtering algorithm is proposed. It is shown that the quality of four-channel filtering deteriorates only slightly compared with the adaptive filtering whereas the computational complexity is reduced several times.

Results of computer simulation are presented. They allow evaluating the reconstruction errors of an impulse signal at the multichannel recorder output versus the accuracy of determining the phase shifts between channels and their gain.

The nonparametric approaches to applied spectral analysis of generally stationary discrete-time stochastic processes are reviewed. The classical periodogram estimator of spectral density f(w) of the analyzed stochastic process and the Welch-type estimator are considered in detail. Practical advice on choosing the parameters of both the statistical estimators is presented.

Synthesis of the structure of an adaptive fuzzy controller for multistructure objects is considered. An algorithm for identifying the fuzzy multistructure model defined as a fuzzy relational equation is described

Results of an experimental study of a two-beam laser method of recording and heterodyne detection of elementary microstructures (microgratings) in

An iterative method for designing a field eikonal that creates conditions for light beam focusing to a given 2D region is considered. The eikonal function that ensures focusing from a circular to rectangular region is calculated. Application of the method to design of refractive optical elements is considered. The refractive element that focuses a plane beam with a circular section to a rectangle is designed.

A method for measurement of a surface microprofile with a nanometer resolution is described. The method is based on partial scanning of correlograms in a Linnik white-light interferometer. Experimental results on measurements of thin film thickness are presented. It is shown that a depth resolution of better than 1 nm can be obtained by correlogram scanning in the range from 1 to 2 periods.

A complementary scanning device control system was developed. In the system, the laser beam is displaced by deflectors inside the writing zone confined by the focusing objective field. The deflectors are placed in a scanning head that, in its turn, can move over the entire writing field. Based on the proposed control system model it is shown that the chosen system implementation allows precision image writing on formats that are much greater than the writing field of the focusing objective; the writing speed is primarily determined by the scanning head deflectors. Results of simulating the system behavior and experimental results are presented.