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Avtometriya

2011

Number: 5

4421.
Effect of Electron Trapping Centers on Electrical and Photoelectric Properties of PbSnTe : In

A. E. Klimov, V. N. Shumsky
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
klimov@thermo.isp.nsc.ru
Keywords: trapping centers, PbSnTe : In, injection from contacts
Pages: 35-42

Abstract >>
Results of experimental studies presenting data on the effect of electron trapping centers on the properties of Pb1−xSnxTe : In with x ≈ 0.24-0.29 at temperatures below 20 K are described. A model is developed that consistently explains a number of phenomena in Pb1−xSnxTe : In solid solutions, including current-voltage characteristics in the absence of light resulting from the injection from contacts and space-charge limited current when electrons are captured in traps distributed in energy in the bandgap, photoelectric phenomena in the infrared and terahertz spectral ranges, features of galvanomagnetic phenomena, and fluctuations and autooscillations of current in the absence or presence of light.



Number: 5

4422.
Formation of Type-II InAs/GaSb Strained Short-Period Superlattices for IR Photodetectors by Molecular Beam Epitaxy

E. A. Emel'yanov, D. F. Feklin, A. V. Vasev, M. A. Putyato, B. R. Semyagin, A. P. Vasilenko, O. P. Pchelyakov, V. V. Preobrazhenskii
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
e2a@nsc/ru, fdf@isp.nsc.ru, vasev@isp.nsc.ru, puma@isp.nsc.ru, sbr@isp.nsc.ru, vap@isp.nsc.ru, pch@isp.nsc.ru, pvv@isp.nsc.ru
Keywords: molecular-beam epitaxy, molecular shape arsenic, short-period superlattice, IR photodetectors, reflection high-energy electron diffraction (RHEED)
Pages: 43-51

Abstract >>
The interaction of the GaSb(001) surface with fluxes of As2, As4, and Sb4 molecules is studied using reflection high-energy electron diffraction. It is shown that As2 molecules interact with a GaSb surface predominantly by an exchange mechanism, and As4 molecules by the vacancy mechanism. It is established that for the reproducible generation of In-Sb heterointerfaces in InAs/GaSb superlattices, one needs to use a flux of As4 molecules rather than As2 molecules.



Number: 5

4423.
Oxidation Kinetics of a Silicon Surface in a Plasma of Oxygen with Inert Gases

A. K. Antonenko1, V. A. Volodin1, M. D. Efremov1, P. S. Zazulya2, G. N. Kamaev1, D. V. Marin1
1 Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences Novosibirsk State University
2 Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
antuan@isp.nsc.ru, volodin@isp.nsc.ru, efremov@isp.nsc.ru, zazulya_ps@ngs.ru, kamaev@isp.nsc.ru, marin@isp.nsc.ru
Keywords: silicon, plasma oxidation, silicon oxide, ellipsometry, atomic-emission spectroscopy
Pages: 52-58

Abstract >>
The plasma oxidation of a silicon surface in an inductive plasma generation reactor were studied using spectroscopic ellipsometry and atomic emission spectroscopy. The effect of inert gases on the formation kinetics of ultrathin SiO2 films is discussed. The effect of intense oxidation of Si in the plasma formed by nominally pure helium was found. It is suggested that this effect is due to the photostimulated acceleration of the reaction at the silicon-oxide interface by the intrinsic optical emission from the helium plasma.



Number: 5

4424.
Optical Properties and Morphology of Diamond-Like Films Obtained in a Supersonic Flow of a Hydrocarbon Plasma

S. N. Svitasheva1, G. A. Pozdnyakov2, D. V. Sheglov1, Y. V. Nastaushev1
1 Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
2 Khristianovich Institute of Theoretical and Applied Mechanics, Siberian Branch, Russian Academy of Sciences
Svitasheva@thermo.isp.nsc.ru, georg@itam.nsc.ru, nast@thermo.isp.nsc.ru, Sheglov@thermo.isp.nsc.ru
Keywords: spectroscopic ellipsometry, atomic-force microscopy, diamond-like carbon films, MHD accelerator of the plasma
Pages: 59-66

Abstract >>
A possibility of using a new method of film synthesis in a supersonic flow of a hydrocarbon plasma generated by a disk-type magnetohydrodynamic accelerator is demonstrated. Two methods are used for characterization of diamond-like carbon films: nondestructive spectroscopic ellipsometry and atomic-force microscopy.



Number: 5

4425.
Ellipsometric Monitoring in Label-Free Microarray Biotechnologies

V. V. Vlasov1, A. N. Sinyakov1, D. V. Pyshnyi1, S. V. Ryhlitskii2, V. N. Kruchinin2, E. V. Spesivtsev2, I. A. Pyshnaya1, E. V. Kostina1, E. D. Dmitrienko1, V. P. Bessmel'tsev3
1 Institute of Chemical Biology and Fundamental Medicine, Siberian Branch, Russian Academy of Sciences
2 Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
3 Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences
sinyakov@niboch.nsc.ru, pyshnyi@niboch.nsc.ru, rhl@isp.nsc.ru, kruch@isp.nsc.ru, evs@isp.nsc.ru, bessmelt@iae.nsk.su
Keywords: ellipsometry, biochips, label-free diagnostics, oligonucleotides, proteins
Pages: 67-77

Abstract >>
The surface of biochips prepared on the basis of silicon wafers for studies of reactions of pre-immobilized oligonucleotides and protein molecules was analyzed by high-resolution scanning ellipsometry. The hybridization interactions of nucleic acid (duplex formation in the reaction of an amplicon of the influenza A virus matrix protein gene with probe molecules), sorption of protein molecules, and protein-protein interactions on the surface of the biochip were detected. It was shown that pre-sorption of gold nanoparticles led to greater efficiency of immobilization of protein molecules on the biochip. The experimental data suggest that that ellipsometry is a highly sensitive, nondestructive and inexpensive label-free method for the detection of the biochip surface, which is suitable for quantitative analysis of reactions of biomolecules.



Number: 5

4426.
Estimation of the Ultimate Efficiency of a Three-Pin Solar Cell Based on the GaAs/Si Heterostructure

D. O. Kuznetsov, E. G. Tishkovskii, D. M. Legan
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
diokuz@thermo.isp.nsc.ru, tish@thermo.isp.nsc.ru
Keywords: ultimate efficiency, solar cell, GaAs/Si heterostructures
Pages: 78-81

Abstract >>
The ultimate efficiency of a three-pin solar cell based on the GaAs/Si structure is calculated by means of numerical simulation in a diffusion-drift approximation. Dependences of the efficiency on the GaAs layer thickness and the density of dislocations threading in this layer, which are known to affect the lifetime of nonequilibrium charge carriers. It is shown that the maximum limit efficiency (27 %) of such a structure is reached at the GaAs layer thickness of about 1.4 µm and the density ofthreading dislocations of less than 106 cm2.



Number: 5

4427.
Dependences of the Optical Characteristics of AlxGa1−xN Films on the Substrate Composition and Polarity

S. N. Svitasheva, K. S. Zhuravlev
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
Svitasheva@thermo.isp.nsc.ru, zhur@thermo.isp.nsc.ru
Keywords: spectroscopic ellipsometry, nitrides of triple compounds, polarity, molecular beam epitaxy, heterostructures
Pages: 82-87

Abstract >>
Optical properties of Ga- and N-polar triple nitrides AlxGa1−xN with molar fractions of aluminum from 0 to 0.6 are studied by a nondestructive contactless method of spectroscopic ellipsometry. Correlation dependences of the shift of the fundamental absorption edge and the behavior of the real and imaginary parts of the pseudodielectric function on the composition x and polarity of the AlxGa1−xN layers are revealed. It is verified that the polarity of the layers grown by molecular beam epitaxy is defined by the formation of the AlN nucleating layer.



Number: 5

4428.
Modeling the Formation of Silicon Nanoclusters during Annealing SiOx layers

E. A. Mikhant'ev1, I. G. Neizvestnyi2, S. V. Usenkov2, N. L. Shvarts2
1 Novosibirsk State Technical University Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
2 Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
mikhantiev@gmail.com, neizv@isp.nsc.ru, simsonic@ya.ru, nataly.shwartz@gmail.com
Keywords: silicon nanoclusters, modeling, Monte Carlo method
Pages: 88-97

Abstract >>
The mechanism of formation of silicon nanoclusters in layers of nonstoichiometric composition is studied by Monte Carlo simulation. Interest in silicon nanoclusters (Si-nc) coated with an oxide layer is due to their applications in modern optoelectronics and nanoelectronics. A lattice Monte Carlo model is proposed to study atomic processes in the Si-SiO2 system. The formation of silicon nanoclusters during annealing of single SiO layers and SiO2-SiO-SiO2 layered structures is studied. Along with the diffusive motion of particles, the model takes into account the formation and collapse of mobile molecules of silicon monoxide. It is shown that accounting for transport of silicon under high-temperature annealing due to the motion of SiO accelerates the formation of Si-nc. Dependences of the size of nanoclusters on temperature, annealing time, and the composition of the SiOx layer are obtained. It is found that annealing of silica films containing layers of nonstoichiometric composition can lead to the formation of silicon nanoclusters or cavities.



Number: 5

4429.
Infrared Scanning Microscope with High Spatial Resolution

V. M. Bazovkin, I. V. Mzhel'skii, G. L. Kuryshev, V. G. Polovinkin
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
bazovkin@isp.nsc.ru, Mzhelskii_ivan@list.ru, kur@isp.nsc.ru, pvg@isp.nsc.ru
Keywords: infrared microscope, scanning system, software, photodetector
Pages: 98-102

Abstract >>
Technical parameters and possible applications of an infrared scanning microscope with a spatial resolution of up to 3 µm are considered. It is shown that the device works with both array and linear photodetectors. Original PC software was designed to control the scanning process interactively and receive and process images of objects in the infrared range,.



Number: 5

4430.
Calibration of Photodetectors in IR Microscopes

G. L. Kuryshev, I. V. Mzhel'skii, A. E. Nastov'yak, V. G. Polovinkin
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
kur@isp.nsc.ru, Mzhelskii_ivan@list.ru, nae@isp.nsc.ru, pvg@isp.nsc.ru
Keywords: infrared microscope, calibration
Pages: 103-108

Abstract >>
Operation of a photodetector in an infrared microscope has a number of features preventing the application of calibration methods known for thermal imaging devices. A differential method of calibration is proposed which gives an opportunity to consider the nonlinearity of the transfer characteristics of the photodetector reading unit and electronic path and the variation of the background radiation flux.




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