A simplified method for evaluation of potential distribution in thin graded gap layers of a photosensitive semiconductor is proposed. Formation of space charge regions in a semiconductor film with a graded gap layer in its middle part, and also with graded gap layers near external surfaces, which are used to control the characteristics of planar photodiodes and to suppress the surface recombination in IR photodetector arrays based on epitaxial MCT layers is considered in a linear approximation.
The modes of pulse transmission in a fiber-optic communication line with in-line nonlinear devices, that is, nonlinear optical loop mirrors (NOLM), are considered. The ability of NOLM to regenerate the pulse shape and suppress spontaneous emission noise is investigated. The possibility of pulse stabilization over a wide range of parameters of the line (optical filter bandwidth) is shown.
The functioning of a distributed computing system in the mode of processing a packet of parallel tasks is considered. A modification of one sequential stochastic algorithm and its parallel implementation are proposed. Results of modeling are presented. They confirm that the obtained algorithms ensure at least a subminimum time of solving tasks
It is shown that results of the conventional fault-tolerant system modeling approach based on architecture analysis proceeding from reliability characteristics of elements do not characterize the fundamental properties of the architectures and are of special character. The proposed generalized statement of the problem of fault-tolerance analysis is based on the axiom of inevitability of faults of system elements (including independent multiple and
An algorithm based on evolutionary computation and templates of functions is described. It is intended for discovering analytical descriptions of new dense families of optimal regular networks. New families of regular parametrically described networks with degrees 3 and 6, which improve the known results, are presented.
A problem of creating a dynamic model for market trends, capable of rapid adaptation to various forms of external adjustment of the rate of securities, is posed and solved.
An optoelectronic method for measuring a surface profile using interference patterns of partially coherent light is considered. An industrial system for measuring surface defects was developed. A block diagram and specifications of the system are presented. A method for estimating the surface profile depth using the polyzonal interference patterns of partially coherent light is proposed. Results of experimental verification of the method are provided.
Results of applying the optical method of signal indication in vortex flowmeters are presented. The challenge is to estimate the influence of two geometrical parameters of the flowmeter optics on the signal-to-noise ratio and find their optimal values. The first of them, that is, the observation angle, is important for improving the signal-to-noise ratio. The second parameter, namely, the spatial distance between the laser and the vortex generator, is important for vortex detectability. In contradiction to the general approach dealing with a zero-cross passing method of signal processing, the Fast Fourier Transform is used to obtain the signal. Based on the obtained results, some recommendations on parameter optimization are presented.
New automated optoelectronic systems for measuring the geometrical parameters of complex-shaped items, including elements of the gas-air track of gas-turbine engines, are described. The main specifications of the systems, their distinctions, and examples of introduction to various branches of the industry are presented.
Accuracy characteristics of the optical method for object dimension measurement on the basis of Fresnel diffraction patterns are considered. The effect of nonuniform illumination of an object inspected on the accuracy of determining its boundaries is analytically estimated. An effective algorithm for reducing the measurement error (caused by this effect) is proposed. It takes into account values of the amplitude and derivative of the illuminating field in the neighborhood of object boundaries and, thus, reduces the error by a factor of several tens.
