I. G. Palchikova1, V. I. Kovalevskii1, and V. V. Shelkovnikov2 1Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia, E-mail: pal@iae.nsk.su 2Novosibirsk Institute of Organic Chemistry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia, E-mail: vsh@nioch.nsc.ru
Pages: 256-261
An experimental assembly is created and a method for simultaneous studying dynamics of phototransformation of holographic photopolymer materials by spectrophotometric and interferometric methods is elaborated. A special diffraction interferometer with combined branches is developed. The interferometer ensures the sensitivity to the change in the refractive index Dn ~ 10-3 for ~100 mm specimens.
G. A. Lenkova
Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia, E-mail: lenkova@iae.nsk.su
Pages: 262-273
Peculiarities of designing and determining the refraction (lens power) and the diffraction efficiency of bifocal hybrid (diffractive-refractive) intraocular lenses (IOL)
A. K. Komarov
Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia, E-mail: komarov@iae.nsk.su
Pages: 274-277
Passive mode-locking with equidistant ultrashort pulses in the laser cavity due to additional weak modulation of the losses or the refractive index is analyzed. The velocity of the relative pulse motion and the time of establishing the harmonic passive mode-locking mode are analytically estimated.
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Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia, E-mail: kolchenko@iae.nsk.su
Pages: 278-283
A multibeam interferometer with oscillating mirrors is theoretically investigated. The exact solution to the main equation for the interferometer and expressions for its transfer functions, i.e., generalized reflection and transmission factors, are obtained in a plane-wave approximation.
Yu. A. Lemeshko, Yu. V. Chugui, and A. K. Yarovaya
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch, Russian Academy of Sciences Novosibirsk, Russia, E-mail: chugui@tdisie.nsc.ru
Pages: 284-291
A method for measuring diameters of circular reflecting cylinders is discussed. The method consists in processing a diffraction pattern that is formed in the near-field zone by illuminating the object edges by a plane monochromatic beam. An equivalent mathematical model of forming a diffraction field is developed and experimentally validated. The model makes it possible to obtain analytical functions describing the distribution of the field from the circular reflecting cylinder. The influence of the cylinder reflecting surface on the diffraction pattern parameters is studied. A highly accurate algorithm is proposed for calculating the diameter of the cylindrical article by its Fresnel diffraction pattern with an error under 1 m.
P. E. Tverdokhleb and Yu. A. Shchepetkin
Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia, E-mail: peter@iae.nsk.su
Pages: 292-298
V. V. Vasilyev1, S. A. Dvoretsky1, V. S. Varavin1, N. N. Mikhailov1, I. V. Marchishin1, Yu. G. Sidorov1, A. O. Suslyakov1, V. N. Ovsyuk1, V. S. Burmasov2, S. S. Popov2, E. P. Kruglyakov2, and A. L. Aseev1 1Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia E-mail: vas@thermo.isp.nsc.ru 2Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
Pages: 299-307
A microwave detector including a single-element infrared (IR) photodiode mounted in a cooled Dewar and a preamplifier is developed. An IR photodiode of the n+
V. V. Vasilyev, S. A. Dvoretsky, V. S. Varavin, N. N. Mikhailov, V. G. Remesnik, Yu. G. Sidorov, A. O. Suslyakov, and A. L. Aseev
Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia E-mail: vas@thermo.isp.nsc.ru
Pages: 308-313
I. I. Lee, V. M. Bazovkin, N. A. Valisheva, A. A. Guzev, V. M. Efimov, A. P. Kovchavtsev, G. L. Kuryshev, V. G. Polovinkin, A. S. Stroganov, and A. V. Tsarenko
Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia E-mail: irlamlee@isp.nsc.ru
Pages: 314-321
I. I. Lee, V. M. Bazovkin, N. A. Valisheva, A. A. Guzev, V. M. Efimov, A. P. Kovchavtsev, G. L. Kuryshev, V. G. Polovinkin, A. S. Stroganov, and A. V. Tsarenko
Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia E-mail: irlamlee@isp.nsc.ru
Pages: 322-331
Results of experimental investigation of thermography systems based on InAs CID elements of line and matrix hybrid modules (a thermal imager and IR microscope) are presented. Owing to a high time stability, in the short-wave IR range, the implemented thermography systems have a temperature resolution of ~(4
